High node count / Limited Access Solutions

 

Arxtron Technologies has a long history of working with high end/high node count complex products. As node count and board density get higher, access becomes a challenge both on the mechanical aspect (real estate availability) and on the electrical aspect (Testers can only accomodate up to ~5000 accessible nets). Arxtron technologies works with customers both at the DFT stage and at the development stage to identify on which nodes access should be prioritized to yield an optimum coverage and avoid coverage overlap with other steps in the test process like X-ray and AOI. Our test access optimization techniques on Keysight3070/Agilent3070/HP 3070 (Medalist i3070) include but not limited to:

 

  • Aware test
  • 1149.1 Boundary scan Interconnect
  • 1149.6 Boundary scan Interconnect
  • Silicon nails
  • Cover extend
  • Magic test
  • Drive thru