DESIGN FOR TESTABILITY & FEASIBILITY STUDIES

Arxtron Technologies has developed a thorough design for testability (DFT) process over the years. Design teams from renowned OEMs in the Telecom, Medical and automotive industries have used Arxtron’s DFT recommendations to maximize and/or optimize their In-circuit (ICT) and boundary scan test coverage.

DESIGN FOR TESTABILITY

Layout analysis
Test access analysis
Fixture analysis
Strain simulation analysis
Design topology analysis (Schematics)
Critical access recommendations
Limited access coverage
Test point reduction techniques
Smart power requirements analysis
Boundary scan requirements analysis
Boundary scan chain analysis
Power sequencing requirements
Flash programming requirements
Flash programming algorithm development
Test coupon analysis
Predictive coverage
DFT report and design reviews

FEASIBILITY STUDIES

BSDL verification
Boundary Scan compliance verification
Boundary scan register integrity
ATE managed power sequencing
Boundary scan cluster test verification
Smart power PMIC programming
ISP programming at ICT (MCU, NAND, eMMC)