Minimize cost by adding your functional test to in-circuit test fixtures for faster product validation
Functional Test Integration into In-Circuit Test Fixtures
Functional Test Integration into In-Circuit Test Fixtures
Detect faults early with precision in-circuit test solutions built for speed, accuracy, and reliability
Test coverage: Up to 90–95% for populated boards
ROI: Significant scrap cost reduction and >25% decrease in rework time
Platforms supported: Keysight 3070, Teradyne TestStation, Digitaltest MTS
At Arxtron Technologies, we offer turnkey functional test integration directly into in-circuit test (ICT) fixtures, maximizing the capabilities of platforms such as the Keysight Medalist i3070. This unified test approach allows electronics manufacturers and OEMs to combine structural testing with functional verification in a single station, reducing floor space, fixture count, and handling time — all while improving test coverage and efficiency
Our experience with Keysight i3070-based test environments allows us to design test solutions that complement the ICT strategy while enabling full functional validation. Whether it’s verifying a microcontroller’s firmware, validating power-on behavior, or testing wireless communication, Arxtron builds scalable, maintainable systems with high reliability and modularity.
Integrated Functional Test Capabilities
Let Arxtron help you leverage your existing i3070 platform by extending it into a comprehensive test solution that supports your product’s full lifecycle — from production to field support.
Arxtron offers robust dual-stage solutions that allow precise control over probe contact for both ICT and functional testing. The second stage enables powered-up functional test in the same fixture, often without requiring a second fixture or handler
Our systems accommodate and trigger BIST modes directly from the fixture, for devices that support internal diagnostics
- UART, USB, I2C, SPI communication lines are tested using custom interface modules integrated within the fixture.
- CAN and LIN buses are verified using active signaling from programmable interfaces.
- Wi-Fi and Bluetooth module validation using integrated antennas.
- Spectrum analyzer integration for RF signal strength and frequency verification.
- OTA (Over-the-Air) test capability within shielded fixture enclosures.
Functional power validation under various conditions using programmable supplies and load modules.
BENEFITS/ VALUE TO THE CUSTOMER
Faster Time to Market
Faster debug cycles and reduced test development overhead help bring products to market more quickly
Improved Test Coverage
Functional test capabilities (UART, USB, I2C, SPI, CAN, etc.) are added directly within the ICT fixture, providing a complete snapshot of the board’s behavior
Reduced Cost & Footprint
Consolidating ICT and functional testing eliminates the need for separate stations, streamlining the production line and reducing capital investment
Enhanced Product Quality
Real-time verification of performance-critical functions (e.g., RF, USB, wireless modules) ensures reliability from the first unit onward
