TestWay™
Electrical DfT Analysis: Performs rule-based testability analysis from schematic or layout to assess node access and control/observe conditions.
Test Coverage Estimation: Calculates actual and potential test coverage for ICT, Flying Probe, AOI, AXI, Boundary Scan, and Functional Test.
Multi-Format Support: Reads data from major CAD and EDA tools including Cadence, Mentor, Zuken, Altium, and more.
Test Strategy Optimization: Simulates different test methods to determine optimal coverage with minimal redundancy and cost.
Interactive Coverage Maps: Graphical visualization of testable nets, devices, and fault coverage with customizable overlays.
Rule-Based Automation: Customizable rule engines for DfT constraints and test coverage goals tailored to specific workflows or standards.
Documentation and Reporting: Generates detailed HTML, Excel, and PDF reports for test specifications, coverage, and test point recommendations.
Integration with Test Platforms: Connects with Aster’s QUAD, QuadView, and third-party tools for seamless transition from analysis to execution.
TestWay™ is a powerful and comprehensive DfT (Design for Testability) and test coverage analysis tool developed by Aster Technologies. It enables electronics designers and test engineers to evaluate, optimize, and validate test strategies at every stage of the PCB design flow. From schematic to layout, TestWay provides deep insight into electrical coverage, allowing users to reduce test cost, improve product quality, and ensure compliance with industry standards—long before the board reaches manufacturing
Key Challenges, Streamlined Solutions
TestWay™ delivers in-depth DfT and coverage analysis from schematic to layout, helping teams validate test strategies and eliminate gaps before production begins.
Real-time DfT analysis during schematic and layout stages provides early visibility into test coverage gaps.
Built-in simulation and testability prediction tools allow informed decision-making to optimize test strategies.
Test coverage maps and metrics help streamline the choice and implementation of cost-effective test techniques.
Supports a wide array of CAD and netlist formats, enabling multi-platform compatibility without preprocessing.
Automated generation of test reports, statistics, and documentation reduces human error and speeds up delivery.
Centralized DfT environment ensures consistent data sharing and alignment across all product lifecycle stages.
Benefits/Value to the Customer
Shorter Time to Market
Enables early detection of test-related issues, minimizing redesign and production delays)
Improved Product Quality
Enhances design testability and reduces the likelihood of undetected defects
Regulatory and OEM Compliance
Ensures adherence to automotive, aerospace, and telecom testability standards through coverage validation
Cross-Department Alignment
Bridges the gap between design and test engineering teams, fostering a collaborative test planning environment
Cost-Effective
Testing
dentifies the most efficient mix of test methods to reduce test time and equipment costs
