High-Performance Manual ICT Fixture & Program Solutions for Keysight Medalist i3070
Manual Fixtures In-Circuit Test Applications
Manual Fixtures In-Circuit Test Applications
Our manual ICT platforms support a wide range of test and production applications, including:
In-Circuit Test Programs & Fixtures Design for Testability (DFT) Reviews Test Feasibility Studies Functional Test Integration (UART, USB, I2C, CAN, Wireless, etc.) ECO Analysis and Rework-Friendly Fixture Design Strain Simulation and Measurement Flash & In-System Programming (ISP) Datalogging Integration and Yield TrackingOn-Site and Off-Site Training Global Support and On-Site Installation Services
At Arxtron Technologies, we deliver tailored manual in-circuit test (ICT) solutions that combine mechanical innovation with test engineering excellence. Designed for Keysight Medalist i3070 systems, our manual test solutions are ideal for NPI, low-to-mid volume production, and engineering test environments requiring flexibility, coverage, and ease of use.
Whether it’s a simple hold-down fixture or a complex high-node-count vacuum fixture with integrated functional testing and datalogging, Arxtron is your trusted partner for precise, efficient and scalable, ICT implementation
Technical Capabilities
Complete ICT Application Coverage
In-Circuit Test Programs & Fixtures
Design for Testability (DFT) Reviews
Test Feasibility Studies
Functional Test Integration (UART, USB, I2C, CAN, Wireless, etc.)
ECO Analysis and Rework-Friendly Fixture Design
Strain Simulation and Measurement
Flash & In-System Programming (ISP)
Datalogging Integration and Yield Tracking
On-Site and Off-Site Training
Global Support and On-Site Installation Services
Fixture Technology Options
Vacuum Fixtures – Stable and uniform probe engagement using vacuum actuation for reliable contact and high node-count designs. Compressed Air Fixtures – Fast and clean actuation in production settings with pneumatic infrastructure. Hold-Down Gate Fixtures – Simple and effective for low-volume production and engineering validation. Short-Wire Fixtures – For high-speed signal integrity and minimal resistance paths. Wireless Fixtures – Eliminates cable clutter and improves long-term reliability for certain interface types.Dual-Stage Fixtures – Enables both ICT and functional testing in one station with precise second-stage actuation.
Advanced Test Features & Technologies
Top and Side Access Probing – To access challenging nodes and connectors. Conventional Probe Technology – Proven reliability and compatibility with most ICT platforms. X-Probe Technology – High-density and long-life probing solutions for compact boards. Vectorless Testing with NanoVTEP – For detecting open pins and lead integrity in BGAs and fine-pitch devices without powered access. High Node Count Fixture Design – Optimized layouts and signal routing for 2- and 4-module i3070 testers.Strain Gauge Measurements – Ensuring mechanical compliance with IPC standards by measuring board deflection during probing.
BENEFITS/ VALUE TO THE CUSTOMER
Durable, easy-maintenance vacuum fixtures for high-volume production
Precision test performance with minimal probe wear
Compatibility with multi-stage hybrid test systems
Reduced operator error and improved test consistency
Engineering support from prototype to scale
